EM 2007

China-Netherlands Bilateral Symposium on Electron Microscopy of Polymer Systems: EM 2007

From 14 - 17 November 2007 the first China-Netherlands Bilateral Symposium on Electron Microscopy of Polymer Systems: EM 2007 was held in Beijing, China.

The Symposium was organized by State Key Laboratory of Polymer Physics and Chemistry, Institute of Chemistry of the Chinese Academy of Sciences and Eindhoven University of Technology, Department of Chemical Engineering and Chemistry, Soft Matter CryoTEM Research Unit.
The proceedings (pdf) can be found here

Speakers:

  • Bernard Lotz (France), Electron microscopy investigation of polymer single crystals, after fifty years.
  • Joachim Loos (Netherlands) Exploring the 3D volume organisation of high-performance organic solar cells.
  • Hiroshi Jinnai (Japan) Self-assembling block copolymer morphologies studied by TEM.
  • Kangbo Lu (Netherlands) 3D Volume reconstruction of polymer blends and composites.
  • Seiji Isoda (Japan) Application of ADF-STEM to organic materials.
  • Hajime Matsumoto HAADF STEM-Tomography: a tool for 3D imaging of crystallized polymer-3D array of lamellar structures in iso-polypropyle spherulette and industrial materials.
  • Erwan Sourthy (Netherlands) TEM tomography of unstained polymer systems.
  • Tang Dong (Netherlands) Recent developments in advanced TEM in polymer study.
  • Bob Vastenhout (Netherlands) The role of ultramicrotomy in determing polymer morphology by TEM.
  • Tianxi Liu (China) TEM study on the multiple melting behaviour of iPS.
  • Decai Yang (China) Morphology of high impact polypropylene.
  • Ingo Lieberwirth (Germany) Imaging of rodlike polylectrolyte micells.
  • Yang Xiaoniu (China) Morphology and crystallization behaviors of large-scale thin polymer film.
  • Shouke Yan (China) Origin of oriented recrystallization of carbon coated pre-oriented ultra thin polymer films.
  • Ishi Talmon (Israel) Nanostructural aggregation in polymer and polymer/surfactant aqueous and non-aqueous solutions imaged by cryo-TEM.
  • Jack Valentijn (Netherlands) Strategies for correlative light microscopy and electron tomography: Getting the best of two worlds.


Participants of EM 2007.


Conference Location


dr. Joachim Loos (middle), Erwan Sourthy and some Japanese guests.